Characterization of crystal growth defects by X-ray methods : proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom / edited by Brian K. Tanner and D. Keith Bowen
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| uuuu-uuuu | Utgivningsland okänt / Ej specificerat |