Characterization of trapping effects, robustness and linearity in GaN HEMTs for high power and low noise microwave amplifiers
- Författare
- Olle Axelsson
- Genre
- theses
- Språk
- Engelska
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| Microwave Electronics Laboratory, Department of Microtechnology and Nanoscience - MC2, Chalmers university of technology | 2016 | Sverige, Gothenburg | 66 sidor : illustrationer | 978-91-7597-335-7 |