Defect control in semiconductors - proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ... Yokohama, Japan, September 17-22, 1989
- Författare
- International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama)
- (Edited by K. Sumino.)
- Genre
- Konferenspublikation, Bibliografi
- Språk
- Engelska
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| 1990 | Nederländerna | 2 vol. ill. | ||
| Elsevier | 1990 | Utgivningsland okänt / Ej specificerat | ||