Defects-recognition Imaging and Physics in Semiconductors XIV: Selected Peer Reviewed Papers From the 14th International Conference on Defects-recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan (Materials Science Forum)
- Författare
- Hiroshi Yamada-Kaneta
- Genre
- Electronic books
- Språk
- Okänt
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| Trans Tech Publications Limited | 2012 | Utgivningsland okänt / Ej specificerat |