Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim
- Författare
- Instrumentation and Automation Shanghai International Conference on Measurement
- Språk
- Okänt

Förlag | År | Ort | Om boken | ISBN |
---|---|---|---|---|
TTP | uuuu-uuuu | Utgivningsland okänt / Ej specificerat | 978-3-03826-521-4 | |
TTP | uuuu-uuuu | Utgivningsland okänt / Ej specificerat |