Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim

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Instrumentation and Automation Shanghai International Conference on Measurement
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TTP uuuu-uuuu Utgivningsland okänt / Ej specificerat 978-3-03826-521-4
TTP uuuu-uuuu Utgivningsland okänt / Ej specificerat