Physical aspects of electron microscopy and microbeam analysis - papers read at the thirty-first annual meeting of the Electron microscopy society of America and the eighth national conference of the Microbeam analysis society of America, held jointly on August 14-17, 1973 in New Orleans
- Författare
- Electron microscopy society of America
- (Ed. by Benjamin M. Siegel, Donald R. Beaman.)
- Genre
- Konferenspublikation
- Språk
- Engelska
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| Wiley | cop. 1975 | USA, New York | 474 sidor. ill., tab |