Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) : 12-14 October 2015, University of Massachusetts Amherst, USA / Institute of Electrical and Electronics Engineers

Författare
Mass.) 2015 : (28th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Amherst
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Okänt
Förlag År Ort Om boken ISBN
uuuu-uuuu Utgivningsland okänt / Ej specificerat 978-1-4799-8606-4