Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings / Dit-Yan Yeung ... et al. (eds.)
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| Springer | uuuu-uuuu | Utgivningsland okänt / Ej specificerat |