Surface, characterization by LEED, RHEED, REM, STM and holography - proceedings of the U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy and Holography : Kona, Hawaii, 16-19 March 1993
- Författare
- Reflection Electron Microscopy and Holography 1993) (Kona : U.-S.-Japan Seminar on Surface Characterization by Electron Diffraction
- (Edited by P.I. Cohen, A. Ichimiya.)
- Genre
- Konferenspublikation
- Språk
- Engelska
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| North-Holland | 1993 | Nederländerna, Amsterdam | S. 261-477 ill. |