Test cost reduction of 3D stacked ICs - test planning and test flow selection

Författare
Breeta Sengupta
(Breeta Sengupta.)
Genre
Avhandlingar, theses
Språk
Engelska
Förlag År Ort Om boken ISBN
Department of Electrical and information technology, Faculty of Engineering, LTH, Lund University, Tryckeriet i E-huset 2020 Sverige, Lund, Lund xxvii, 187 sidor illustrationer 24 cm 978-91-7895-562-6
Department of Electroscience, Lund University 2020 Sverige, Lund 978-91-7895-563-3