The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
- Författare
- author. Institute of Electrical and Electronics Engineers
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- Okänt
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| IEEE | uuuu-uuuu | Utgivningsland okänt / Ej specificerat |