Value analysis tear-down - a new process for product development and innovation
- Författare
- Yoshihiko. Sato
- (Yoshihiko Sato and J. Jerry Kaufman.)
- Genre
- Biografi, Electronic books., Bibliografi
- Språk
- Engelska
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| Industrial Press, Society of Manufacturing Engineers | 2005 | New York, New York | x, 206 sidor. ill. 24 cm. | 978-1-61583-579-9 |