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Sökning efter: International Test Conference
83 träffar
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Titel |
Författare |
År |
Språk |
21 |
Proceedings of the 1989 International Conference on Microelectronic Test Structures : 13-14 March 1989
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Scotland) (1989 IEEE International Conference on Microelectronic Test Structures Edinburgh
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Okänt |
22 |
ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan
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IEEE International Conference on Microelectronic Test Structures Corporate Author
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Okänt |
23 |
2019 IEEE International Test Conference (ITC) : Washington, DC, USA 9-15 November 2019 / International Test Conference
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Author. International Test Conference
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24 |
2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan
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IEEE International Conference on Microelectronic Test Structures Corporate Author
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25 |
Third International Conference on the Economics of Design, Test, and Manufacturing : proceedings, May 16-17, 1994, Austin, Texas
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Test International Conference on the Economics of Design
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26 |
Proceedings - International Test Conference (25th : 1994 : Washington D.C)
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International Test Conference Washington D.C) 1994 : (25th
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Okänt |
27 |
International Test Conference, 1991 : proceedings
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Tenn.) 1991 : (22nd International Test Conference Nashville
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28 |
2006 IEEE International Test Conference : Santa Clara, CA : 22-27 October 2006
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Calif.) 2006 : (37th International Test Conference Santa Clara
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29 |
Proceedings International Test Conference 2003 : September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA
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N.C.) 2003 : (34th International Test Conference Charlotte
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30 |
2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
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Tunisia) 2006 : (1st International Conference on Design & Test of Integrated Systems in Nanoscale Technology Tunis
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Okänt |
31 |
2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX
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Texas.) (2005 International Test Conference Austin
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Okänt |
32 |
Proceedings
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D.C.) (1995 International Test Conference Washington
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Okänt |
33 |
Proceedings
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International Test Conference Corporate Author
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Okänt |
34 |
The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
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D.C.) 1990 : (21st International Test Conference Washington
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Okänt |
35 |
IEEE International Joint Symposia on Intelligence and Systems : proceedings, May 21-23, 1998, Rockville, Maryland
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Pa.) 1984 : (15th International Test Conference Philadelphia
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Okänt |
36 |
Proceedings, International Test Conference 1999
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N.J.) 1999 : (30th International Test Conference Atlantic City
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Okänt |
37 |
2000 International Test Conference
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N.J.) 2000 : (31th International Test Conference Atlantic City
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Okänt |
38 |
Discover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA
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Md.) (1992 International Test Conference Baltimore
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39 |
Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
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Md.) (1993 International Test Conference Baltimore
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40 |
ITC-Asia : 2017 International Test Conference in Asia : 13-15 September 2017
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Taiwan) (2017 International Test Conference Taipei
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