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Sökning efter: International Test Conference 82 träffar

Titel Författare År Språk
61 Proceedings 1994, Oct. 2-6, Washington, D.C. International Test Conference Cop. 1994 Engelska
62 Proceedings 1995, Washington, D.C., Oct. 21-25, 1995 International Test Conference Cop. 1995 Engelska
63 Proceedings 1996, Washington, DC, Oct. 20-24, 1996 International Test Conference Cop. 1996 Engelska
64 Proceedings 1997, Washington, DC, October 20-24, 1997 International Test Conference Cop. 1997 Engelska
65 Proceedings 1998, Oct. 19-21, 1998, Washington, D.C. International Test Conference Cop. 1998 Engelska
66 ICMTS 1991 - proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan International Conference on Microelectronic Test Structures 1991) (Kyoto : cop. 1991 Engelska
67 ICMTS 1995 - proceedings of the 1995 International Conference on Microelectronic Test Structures : March 22-25, 1995, Nara, Japan International Conference on Microelectronic Test Structures 1995) (Nara : cop. 1995 Engelska
68 ICMTS 93 - proceedings of the 1993 International Conference on Microelectronic Test Structures : March 22-25, 1993, Sitges, Barcelona, Spain International Conference on Microelectronic Test Structures 1993) (Barcelona : cop. 1993 Engelska
69 International conference on an immunochemical LH-test, Amsterdam, The Netherlands ... 1969 International conference on an immunochemical LH-test (Amsterdam : 1969) 1969 Engelska
70 Proceedings. International conference on an immunochemical LH-test (Amsterdam : 1969) 1969 Okänt
71 1997 IEEE International Conference on Microelectronic Test Structures - proceedings : March 17-20, 1997, Monterey, California IEEE International Conference on Microelectronic Test Structures (1997 : Monterey) cop. 1997 Engelska
72 Advanced measurement and test - selected peer reviwied papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China International Conference on Advanced Measurement and Test (2010 : Sanya) cop. 2010 Engelska
73 ICMTS 1989 - proceedings of the 1989 International Conference on Microelectronic Test Structures : Edinburgh - Scotland, 13-14th March 1989 International Conference on Microelectronic Test Structures 1989) Edinburgh : cop. 1989 Engelska
74 ICMTS 1990 - proceedings of the 1990 International Conference on Microelectronic Test Structures : March 5-7, 1990, San Diego, California International Conference on Microelectronic Test Structures 1990) (San Diego : cop. 1990 Engelska
75 ICMTS 1996 - 1996 IEEE International Conference on Microelectronic Test Structures, March 25-28, 1996, Trento, Italy : proceedings IEEE International Conference on Microelectronic Test Structures (1996 : Trento) cop. 1996 Engelska
76 ICMTS 1998 - proceedings of the 1998 International conference on microelectronic test structures : March 23-26, 1998, Kanazawa, Japan IEEE International conference on microelectronic test structures 1998) (Kanazawa : Cop. 1998 Engelska
77 ICMTS 92 - proceedings of the 1992 International Conference on Microelectronic Test Structures, March 16-19, 1992, San Diego, California International Conference on Microelectronic Test Structures 1992) (San Diego : cop. 1992 Engelska
78 ICMTS 94 - proceedings of the 1994 International Conference on Microelectronic Test Structures : March 22-25, 1994, San Diego, California International Conference on Microelectronic Test Structures 1994) (San Diego : cop. 1994 Engelska
79 Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS - Long Beach, California, February 22-23, 1988 IEEE International Conference on Microelectronic Test Structures (Long Beach : 1988) cop. 1988 Engelska
80 Proceedings of the third International SweMas Conference - Umeå, October 14-15, 2003 International Swedish Mathematics and Science test Conference Umeå : 2003) 2005 Engelska

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