61 |
Proceedings 1994, Oct. 2-6, Washington, D.C.
|
International Test Conference
|
Cop. 1994 |
Engelska |
62 |
Proceedings 1995, Washington, D.C., Oct. 21-25, 1995
|
International Test Conference
|
Cop. 1995 |
Engelska |
63 |
Proceedings 1996, Washington, DC, Oct. 20-24, 1996
|
International Test Conference
|
Cop. 1996 |
Engelska |
64 |
Proceedings 1997, Washington, DC, October 20-24, 1997
|
International Test Conference
|
Cop. 1997 |
Engelska |
65 |
Proceedings 1998, Oct. 19-21, 1998, Washington, D.C.
|
International Test Conference
|
Cop. 1998 |
Engelska |
66 |
ICMTS 1991 - proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan
|
International Conference on Microelectronic Test Structures 1991) (Kyoto :
|
cop. 1991 |
Engelska |
67 |
ICMTS 1995 - proceedings of the 1995 International Conference on Microelectronic Test Structures : March 22-25, 1995, Nara, Japan
|
International Conference on Microelectronic Test Structures 1995) (Nara :
|
cop. 1995 |
Engelska |
68 |
ICMTS 93 - proceedings of the 1993 International Conference on Microelectronic Test Structures : March 22-25, 1993, Sitges, Barcelona, Spain
|
International Conference on Microelectronic Test Structures 1993) (Barcelona :
|
cop. 1993 |
Engelska |
69 |
International conference on an immunochemical LH-test, Amsterdam, The Netherlands ... 1969
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International conference on an immunochemical LH-test (Amsterdam : 1969)
|
1969 |
Engelska |
70 |
Proceedings.
|
International conference on an immunochemical LH-test (Amsterdam : 1969)
|
1969 |
Okänt |
71 |
1997 IEEE International Conference on Microelectronic Test Structures - proceedings : March 17-20, 1997, Monterey, California
|
IEEE International Conference on Microelectronic Test Structures (1997 : Monterey)
|
cop. 1997 |
Engelska |
72 |
Advanced measurement and test - selected peer reviwied papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
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International Conference on Advanced Measurement and Test (2010 : Sanya)
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cop. 2010 |
Engelska |
73 |
ICMTS 1989 - proceedings of the 1989 International Conference on Microelectronic Test Structures : Edinburgh - Scotland, 13-14th March 1989
|
International Conference on Microelectronic Test Structures 1989) Edinburgh :
|
cop. 1989 |
Engelska |
74 |
ICMTS 1990 - proceedings of the 1990 International Conference on Microelectronic Test Structures : March 5-7, 1990, San Diego, California
|
International Conference on Microelectronic Test Structures 1990) (San Diego :
|
cop. 1990 |
Engelska |
75 |
ICMTS 1996 - 1996 IEEE International Conference on Microelectronic Test Structures, March 25-28, 1996, Trento, Italy : proceedings
|
IEEE International Conference on Microelectronic Test Structures (1996 : Trento)
|
cop. 1996 |
Engelska |
76 |
ICMTS 1998 - proceedings of the 1998 International conference on microelectronic test structures : March 23-26, 1998, Kanazawa, Japan
|
IEEE International conference on microelectronic test structures 1998) (Kanazawa :
|
Cop. 1998 |
Engelska |
77 |
ICMTS 92 - proceedings of the 1992 International Conference on Microelectronic Test Structures, March 16-19, 1992, San Diego, California
|
International Conference on Microelectronic Test Structures 1992) (San Diego :
|
cop. 1992 |
Engelska |
78 |
ICMTS 94 - proceedings of the 1994 International Conference on Microelectronic Test Structures : March 22-25, 1994, San Diego, California
|
International Conference on Microelectronic Test Structures 1994) (San Diego :
|
cop. 1994 |
Engelska |
79 |
Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS - Long Beach, California, February 22-23, 1988
|
IEEE International Conference on Microelectronic Test Structures (Long Beach : 1988)
|
cop. 1988 |
Engelska |
80 |
Proceedings of the third International SweMas Conference - Umeå, October 14-15, 2003
|
International Swedish Mathematics and Science test Conference Umeå : 2003)
|
2005 |
Engelska |