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Sökning efter: IEEE International Conference on Microelectronic Test Structures 17 träffar

Titel Författare År Språk
1-2 ICMTS 2015 : proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona / sponsored by the IEEE Electron Devices Society (flera utgåvor) Ariz.) (2015 IEEE International Conference on Microelectronic Test Structures Tempe uuuu-uuuu Okänt
3 ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan IEEE International Conference on Microelectronic Test Structures Corporate Author uuuu-uuuu Okänt
4-5 ICMTS : 2019 IEEE 32nd International Conference on Microelectronic Test Structures : March 18-21, Kitakyushu International Conference Center, Kitakyushu City, Fukuoka Prefecture, Japan / Institute of Electrical and Electronics Engineers (flera utgåvor) Japan) 2019 : (32nd IEEE International Conference on Microelectronic Test Structures Kitakyūshū-shi uuuu-uuuu Okänt
6-7 2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / IEEE Electron Devices Society (flera utgåvor) Tex.) (2018 IEEE International Conference on Microelectronic Test Structures Austin uuuu-uuuu Okänt
8 Proceedings of the 1989 International Conference on Microelectronic Test Structures : 13-14 March 1989 Scotland) (1989 IEEE International Conference on Microelectronic Test Structures Edinburgh uuuu-uuuu Okänt
9 ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan IEEE International Conference on Microelectronic Test Structures Corporate Author uuuu-uuuu Okänt
10 2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan IEEE International Conference on Microelectronic Test Structures Corporate Author uuuu-uuuu Okänt
11 "2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan" IEEE International Conference on Microelectronic Test Structures 2007 Okänt
12 Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS - Long Beach, California, February 22-23, 1988 IEEE International Conference on Microelectronic Test Structures (Long Beach : 1988) cop. 1988 Engelska
13 Special issue on ICMTS '93 1994 Engelska
14 ICMTS 1996 - 1996 IEEE International Conference on Microelectronic Test Structures, March 25-28, 1996, Trento, Italy : proceedings IEEE International Conference on Microelectronic Test Structures (1996 : Trento) cop. 1996 Engelska
15 1997 IEEE International Conference on Microelectronic Test Structures - proceedings : March 17-20, 1997, Monterey, California IEEE International Conference on Microelectronic Test Structures (1997 : Monterey) cop. 1997 Engelska
16 ICMTS 1998 - proceedings of the 1998 International conference on microelectronic test structures : March 23-26, 1998, Kanazawa, Japan IEEE International conference on microelectronic test structures 1998) (Kanazawa : Cop. 1998 Engelska
17 Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS - Long Beach, California, February 22-23, 1988 IEEE International Conference on Microelectronic Test Structures 1988) (Long Beach : cop. 1988 Engelska

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