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Sökning efter: International Test Conference
83 träffar
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Titel |
Författare |
År |
Språk |
1 |
International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
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N.C.) 2004 : (35th International Test Conference Charlotte
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Okänt |
2-3 |
ICMTS 2015 : proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona / sponsored by the IEEE Electron Devices Society
(flera utgåvor)
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Ariz.) (2015 IEEE International Conference on Microelectronic Test Structures Tempe
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Okänt |
4 |
ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
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IEEE International Conference on Microelectronic Test Structures Corporate Author
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Okänt |
5-6 |
ICMTS : 2019 IEEE 32nd International Conference on Microelectronic Test Structures : March 18-21, Kitakyushu International Conference Center, Kitakyushu City, Fukuoka Prefecture, Japan / Institute of Electrical and Electronics Engineers
(flera utgåvor)
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Japan) 2019 : (32nd IEEE International Conference on Microelectronic Test Structures Kitakyūshū-shi
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Okänt |
7-8 |
Proceedings
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International Test Conference
|
1996 |
Okänt |
9 |
"Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China"
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International Conference on Advanced Measurement and Test
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2010 |
Okänt |
10 |
"Progress in measurement and testing : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China"
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International Conference on Advanced Measurement and Test
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2010 |
Okänt |
11 |
Proceedings - International Test Conference (25th : 1994 : Washington D.C)
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International Test Conference
|
1994 |
Okänt |
12 |
"International Test Conference, 1991 : proceedings"
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International Test Conference
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1991 |
Okänt |
13 |
2018 IEEE International Test Conference in Asia : 15-17 August 2018, Harbin, China / IEEE Computer Society
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China) (2018 IEEE International Test Conference in Asia Harbin
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Okänt |
14 |
New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC
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D.C.) (1988 International Test Conference Washington
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Okänt |
15-16 |
2018 IEEE International Test Conference : 29 October-1 November 2018, Phoenix, AZ, USA / Institute of Electrical and Electronics Engineers
(flera utgåvor)
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Ariz.) (2018 IEEE International Test Conference Phoenix
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Okänt |
17 |
ITC-Asia : 2017 International Test Conference in Asia : 13-15 September 2017
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Taiwan) (2017 International Test Conference Taipei
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Okänt |
18 |
2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / IEEE Electron Devices Society
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Tex.) (2018 IEEE International Conference on Microelectronic Test Structures Austin
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Okänt |
19 |
ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA
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Maryland) 2001 : (32nd International Test Conference Baltimore
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Okänt |
20 |
"2006 IEEE International Test Conference : Santa Clara, CA : 22-27 October 2006"
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International Test Conference
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2006 |
Okänt |
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