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Sökning efter: International Test Conference 82 träffar

Titel Författare År Språk
1 "2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan" IEEE International Conference on Microelectronic Test Structures 2007 Okänt
2-3 2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / IEEE Electron Devices Society (flera utgåvor) Tex.) (2018 IEEE International Conference on Microelectronic Test Structures Austin uuuu-uuuu Okänt
4 2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan IEEE International Conference on Microelectronic Test Structures Corporate Author uuuu-uuuu Okänt
5 ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan IEEE International Conference on Microelectronic Test Structures Corporate Author uuuu-uuuu Okänt
6 ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan IEEE International Conference on Microelectronic Test Structures Corporate Author uuuu-uuuu Okänt
7 Proceedings of the 1989 International Conference on Microelectronic Test Structures : 13-14 March 1989 Scotland) (1989 IEEE International Conference on Microelectronic Test Structures Edinburgh uuuu-uuuu Okänt
8-9 ICMTS : 2019 IEEE 32nd International Conference on Microelectronic Test Structures : March 18-21, Kitakyushu International Conference Center, Kitakyushu City, Fukuoka Prefecture, Japan / Institute of Electrical and Electronics Engineers (flera utgåvor) Japan) 2019 : (32nd IEEE International Conference on Microelectronic Test Structures Kitakyūshū-shi uuuu-uuuu Okänt
10-11 ICMTS 2015 : proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona / sponsored by the IEEE Electron Devices Society (flera utgåvor) Ariz.) (2015 IEEE International Conference on Microelectronic Test Structures Tempe uuuu-uuuu Okänt
12-13 2018 IEEE International Test Conference in Asia : 15-17 August 2018, Harbin, China / IEEE Computer Society (flera utgåvor) China) (2018 IEEE International Test Conference in Asia Harbin uuuu-uuuu Okänt
14-15 2018 IEEE International Test Conference : 29 October-1 November 2018, Phoenix, AZ, USA / Institute of Electrical and Electronics Engineers (flera utgåvor) Ariz.) (2018 IEEE International Test Conference Phoenix uuuu-uuuu Okänt
16 Advanced measurement and test : selected, peer reviewed papers from the 2011 International conference on advanced measurement and test (AMT 2011), June 24-26, 2011, Nanchang, China / edited by Riza Esa and Yanwen Wu China) International Conference on Advanced Measurement and Test (2011 : Nanchang uuuu-uuuu Okänt
17 Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China / edited by Yanwen Wu China) (2010 International Conference on Advanced Measurement and Test Sanya Shi uuuu-uuuu Okänt
18 Progress in measurement and testing : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China / edited by Yanwen Wu China) (2010 International Conference on Advanced Measurement and Test Sanya Shi uuuu-uuuu Okänt
19 Advanced measurement and test III : selected, peer reviewed papers from the 2013 3rd International Conference on Advanced Measurement and Test (AMT 2013), March 13-14, 2013, Xiamen, China / edited by Andy Wu China) 2013 : (3rd International Conference on Advanced Measurement and Test Xiamen uuuu-uuuu Okänt
20 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings Tunisia) 2006 : (1st International Conference on Design & Test of Integrated Systems in Nanoscale Technology Tunis uuuu-uuuu Okänt

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