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Sökning efter: International Test Conference 47 träffar

Titel Författare År Språk
1 ICMTS : 2019 IEEE 32nd International Conference on Microelectronic Test Structures : March 18-21, Kitakyushu International Conference Center, Kitakyushu City, Fukuoka Prefecture, Japan / Institute of Electrical and Electronics Engineers Japan) 2019 : (32nd IEEE International Conference on Microelectronic Test Structures Kitakyūshū-shi uuuu-uuuu Okänt
2-3 Proceedings (flera utgåvor) International Test Conference 1996 Okänt
4 "Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China" International Conference on Advanced Measurement and Test 2010 Okänt
5 "Progress in measurement and testing : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China" International Conference on Advanced Measurement and Test 2010 Okänt
6 Proceedings - International Test Conference (25th : 1994 : Washington D.C) International Test Conference 1994 Okänt
7 "International Test Conference, 1991 : proceedings" International Test Conference 1991 Okänt
8 2018 IEEE International Test Conference in Asia : 15-17 August 2018, Harbin, China / IEEE Computer Society China) (2018 IEEE International Test Conference in Asia Harbin uuuu-uuuu Okänt
9 2018 IEEE International Test Conference : 29 October-1 November 2018, Phoenix, AZ, USA / Institute of Electrical and Electronics Engineers Ariz.) (2018 IEEE International Test Conference Phoenix uuuu-uuuu Okänt
10 ITC-Asia : 2017 International Test Conference in Asia : 13-15 September 2017 Taiwan) (2017 International Test Conference Taipei uuuu-uuuu Okänt
11 2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / IEEE Electron Devices Society Tex.) (2018 IEEE International Conference on Microelectronic Test Structures Austin uuuu-uuuu Okänt
12 ICMTS 2015 : proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona / sponsored by the IEEE Electron Devices Society Ariz.) (2015 IEEE International Conference on Microelectronic Test Structures Tempe uuuu-uuuu Okänt
13 Digest of papers 1981, October 27, 28, & 29, 1981, Philadelphia International Test Conference Cop. 1981 Engelska
14 Digest of papers 1982, November 15-18, 1982, Philadelphia International Test Conference Cop. 1982 Engelska
15 Proceedings 1991, October 26-30, 1991, Nashville, Tenn. International Test Conference Cop. 1991 Engelska
16 Proceedings 1993, October 17-21, 1993, Baltimore, MD International Test Conference Cop. 1993 Engelska
17 Proceedings 1994, Oct. 2-6, Washington, D.C. International Test Conference Cop. 1994 Engelska
18 Proceedings 1995, Washington, D.C., Oct. 21-25, 1995 International Test Conference Cop. 1995 Engelska
19 Proceedings 1996, Washington, DC, Oct. 20-24, 1996 International Test Conference Cop. 1996 Engelska
20 Proceedings 1997, Washington, DC, October 20-24, 1997 International Test Conference Cop. 1997 Engelska

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