1 |
ICMTS : 2019 IEEE 32nd International Conference on Microelectronic Test Structures : March 18-21, Kitakyushu International Conference Center, Kitakyushu City, Fukuoka Prefecture, Japan / Institute of Electrical and Electronics Engineers
|
Japan) 2019 : (32nd IEEE International Conference on Microelectronic Test Structures Kitakyūshū-shi
|
uuuu-uuuu |
Okänt |
2-3 |
Proceedings
(flera utgåvor)
|
International Test Conference
|
1996 |
Okänt |
4 |
"Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China"
|
International Conference on Advanced Measurement and Test
|
2010 |
Okänt |
5 |
"Progress in measurement and testing : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China"
|
International Conference on Advanced Measurement and Test
|
2010 |
Okänt |
6 |
Proceedings - International Test Conference (25th : 1994 : Washington D.C)
|
International Test Conference
|
1994 |
Okänt |
7 |
"International Test Conference, 1991 : proceedings"
|
International Test Conference
|
1991 |
Okänt |
8 |
2018 IEEE International Test Conference in Asia : 15-17 August 2018, Harbin, China / IEEE Computer Society
|
China) (2018 IEEE International Test Conference in Asia Harbin
|
uuuu-uuuu |
Okänt |
9 |
2018 IEEE International Test Conference : 29 October-1 November 2018, Phoenix, AZ, USA / Institute of Electrical and Electronics Engineers
|
Ariz.) (2018 IEEE International Test Conference Phoenix
|
uuuu-uuuu |
Okänt |
10 |
ITC-Asia : 2017 International Test Conference in Asia : 13-15 September 2017
|
Taiwan) (2017 International Test Conference Taipei
|
uuuu-uuuu |
Okänt |
11 |
2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / IEEE Electron Devices Society
|
Tex.) (2018 IEEE International Conference on Microelectronic Test Structures Austin
|
uuuu-uuuu |
Okänt |
12 |
ICMTS 2015 : proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona / sponsored by the IEEE Electron Devices Society
|
Ariz.) (2015 IEEE International Conference on Microelectronic Test Structures Tempe
|
uuuu-uuuu |
Okänt |
13 |
Digest of papers 1981, October 27, 28, & 29, 1981, Philadelphia
|
International Test Conference
|
Cop. 1981 |
Engelska |
14 |
Digest of papers 1982, November 15-18, 1982, Philadelphia
|
International Test Conference
|
Cop. 1982 |
Engelska |
15 |
Proceedings 1991, October 26-30, 1991, Nashville, Tenn.
|
International Test Conference
|
Cop. 1991 |
Engelska |
16 |
Proceedings 1993, October 17-21, 1993, Baltimore, MD
|
International Test Conference
|
Cop. 1993 |
Engelska |
17 |
Proceedings 1994, Oct. 2-6, Washington, D.C.
|
International Test Conference
|
Cop. 1994 |
Engelska |
18 |
Proceedings 1995, Washington, D.C., Oct. 21-25, 1995
|
International Test Conference
|
Cop. 1995 |
Engelska |
19 |
Proceedings 1996, Washington, DC, Oct. 20-24, 1996
|
International Test Conference
|
Cop. 1996 |
Engelska |
20 |
Proceedings 1997, Washington, DC, October 20-24, 1997
|
International Test Conference
|
Cop. 1997 |
Engelska |